Scanning Probe Microscopy Systems
Scanning probe microscopy systems offering a true multi-technique capability including: UHV SPM at variable temperatures (from 25 K to 1500 K) Low temperatures (down to 0.5 K) Large samples of up to 4“ in diameter Available as system solutions or stand-alone components
Visit the Oxford Instruments NanoScience website for more information on Scanning Probe Microscopy Systems
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