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Biased and Unbiased HAST Testing

 Considered within the semiconductor industry as the quick and effective alternative to Temperature Humidity Bias testing (THB), Highly-Accelerated Temperature and Humidity Stress Test (HAST) is an important part of the device package Qualification process and is used to evaluate the reliability of non-hermetic packaged devices in humid environments. ?
Biased and Unbiased HAST Testing

Visit the Reltech Ltd website for more information on Biased and Unbiased HAST Testing

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