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Biased HAST DUT Board Design And Manufacturing

 Biased HAST DUT Board Design And Manufacturing

Considered within the semiconductor industry as the fast and effective alternative to Temperature Humidity Bias testing (THB), Highly-Accelerated Temperature and Humidity Stress Test (HAST) is a critical part of the device package Qualification process and is used to evaluate the reliability of non-hermetic packaged devices in humid environments.
Biased HAST DUT Board Design And Manufacturing

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