Menu

Full Turnkey Biased HAST Testing Services

Full Turnkey Biased HAST Testing Services

Considered within the semiconductor industry as the fast and effective alternative to Temperature Humidity Bias testing (THB), Highly-Accelerated Temperature and Humidity Stress Test (HAST) is a critical part of the device package Qualification process and is used to evaluate the reliability of non-hermetic packaged devices in humid environments.

Please feel free to contact us +44 (0)1453 541200 for more details.

Visit the Reltech Ltd website for more information on Full Turnkey Biased HAST Testing Services

ENQUIRY FORM

More Products

  • HTOL Test Driver Boards For Accelerated Life Tests

  • High Temperature Operating Life Stress Testing In Electronics

  • Halt Stress Testing For Product Design Validation

  • HTOL Stress Test Platforms For Extended Thermal And Voltage Cycling