Menu

Low Geometry Semiconductor Devices

 Today's low geometry semiconductor devices need a different approach to performing High Temperature Operating Life (HTOL) and ''Burn-In''. Core Leakage currents vary greatly between device die, even when from the same wafer, and are higher than those of larger geometry devices.
Low Geometry Semiconductor Devices

Visit the Reltech Ltd website for more information on Low Geometry Semiconductor Devices

ENQUIRY FORM

More Products

  • HTOL Test Driver Boards For Accelerated Life Tests

  • High Temperature Operating Life Stress Testing In Electronics

  • Halt Stress Testing For Product Design Validation

  • HTOL Stress Test Platforms For Extended Thermal And Voltage Cycling