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Reltech Independent Test Laboratory Solutions

 Reltech Independent Test Laboratory Solutions

Today's low geometry semiconductor devices require a?different approach to performing High Temperature?Operating Life (HTOL) and "Burn-In". Core Leakage currents?vary greatly between device die, even when from the same?wafer, and are significantly higher than those of larger?geometry devices. These leakage currents result?in self-heating within the device and increased junction?temperatures (Tj).?In order to control the junction temperature to within?acceptable limits and to increase product yield, it is?necessary to control the temperature of each device?independently. This is not possible in conventional?chamber based HTOL systems.?
Reltech Independent Test Laboratory Solutions

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