PJP 6005-IEC-Jv Grabber Test Probe with 4 mm Socket and Flexible Shaft
- Electro-PJP 6005-IEC-Jv Grabber Test Probe with 4 mm Socket and Flexible Shaft
- A flexible grabber test probe with 4mm banana socket interface able to connect to leads and a multimeter/ instrument.
- Rated at 1000V CAT II / 6 A IEC61010
- A good all-round test probe for when you need to connect onto component legs or bare wires. The flexible probe arm is great for confined spaces and the grabbers are easy to deploy and latch onto a component.
- View the Datasheet for more information.
- Discontinued - Last Stock
Visit the Warwick Test Supplies website for more information on PJP 6005-IEC-Jv Grabber Test Probe with 4 mm Socket and Flexible Shaft
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